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Thermo Scientific Niton XL2 Handheld XRF Precious Metal Analyzer
The Thermo Scientific Niton XL2 Handheld XRF Precious Metal Analyzer is a high-performance non-destructive testing solution designed for rapid and accurate identification of gold, silver, and other precious metals. This advanced handheld analyzer provides laboratory-level results directly at the testing location, making it ideal for jewelry industries, metal recyclers, pawn shops, and quality control applications.
Equipped with Silicon Drift Detector (SDD) technology and powerful X-Ray fluorescence analysis, the Niton XL2 delivers precise elemental composition and karat analysis of precious metals. Its rugged handheld design, touch screen interface, and advanced connectivity options allow operators to perform quick material verification with confidence in demanding industrial environments.
Product Specifications
| Product Name | Thermo Scientific Niton XL2 Handheld XRF Precious Metal Analyzer |
|---|---|
| Brand | Thermo Scientific |
| Analyzer Type | Handheld |
| Analysis Method | XRF (X-Ray Fluorescence) |
| Detector | Silicon Drift Detector |
| Element Range | Mg to U |
| Tube Type | Ag / Rh Anode |
| Display Type | Touch Screen |
| Data Transfer | Bluetooth & USB |
| Sample Types | Solids |
| Material Type | Metal |
Key Features
- Advanced Silicon Drift Detector technology for accurate elemental analysis
- Fast and non-destructive testing of precious metals and alloys
- Handheld point-and-shoot design for on-site testing
- Touch screen display with user-friendly operation
- Bluetooth and USB connectivity for efficient data management
- Reliable identification of gold, silver, and alloy composition
Applications
The Thermo Scientific Niton XL2 Handheld XRF Analyzer is widely used in jewelry testing, precious metal verification, mining, metal recycling, quality inspection, manufacturing, and industrial material analysis. It helps businesses verify metal purity, identify alloy compositions, detect gold plating, and ensure accurate valuation of precious materials.
Working Principle
The Niton XL2 uses X-Ray Fluorescence (XRF) technology to analyze material composition. When X-rays are directed onto a sample surface, the atoms emit characteristic fluorescent energy. The Silicon Drift Detector captures these signals and identifies the elements present in the material, providing fast and accurate elemental analysis without damaging the sample.
